CAN XL physical layer (part 2)

The second session on the CAN XL physical layer provides an in-depth view to the signal improvement capability (SIC) concept and the CAN XL mode-switching mechanism. In addition, participants learn how waveform measurements and eye-diagram analysis can be used to assess signal integrity and communication robustness.

CAN XL physical layer - System view (Danny Bacic, Texas Instruments**)

• CAN SIC and CAN SIC XL physical layer overview:
  - Especially: compared to CAN FD  
• FAST mode signaling structure in CAN SIC XL transceivers:
  - FAST TX
  - FAST RX

CAN XL physical layer - Wave forms, thresholds, topologies (Magnus-Maia Hell, CiA Technical Director**)

• Introduction into the concept of SIC transceiver
• Introduction into the concept of SIC XL transceiver
• Maximum possible arbitration bit rates and data bit rates with:
  - ECU internal delay
  - Maximum possible distance between ECUs
  - CAN XL eye diagram
• Mixed networks with:
  - CAN FD, CAN SIC, and CAN SIC XL transceiver in a CAN XL network
  - CAN FD, CAN SIC, and CAN SIC XL transceiver in a CAN FD or CAN XL network

CAN XL physical layer: eye diagrams, masks and network design (Axel Engelhard, NXP**)

• From CAN FD to CAN XL – evolution of the topology evaluation methodology
• Eye-diagram generation and mask evaluation for CAN XL
• CiA 612 system-design guidance
   

* Preliminary agenda; subject to be changed.
** CiA would like to express its gratitude to its members NXP and Texas Instruments for their active support and for sharing their expertise and real-world experiences.

8:00 to 9:00 Berlin, DE time
 

Free-of-charge;
registration obligatory

events(at)can-cia.org

English